I have a 300G Western Digital Raptor, recently showing UNC SMART, wondering anyone who has experience knows should I replace it and get warranty form WD?
Details of smartctl -a as follows:
smartctl 5.41 2011-06-09 r3365 [FreeBSD 8.2-RELEASE-p6 amd64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital VelociRaptor
Device Model: WDC WD3000HLFS-01G6U0
Serial Number: WD-WXD0C79C8807
LU WWN Device Id: 5 0014ee 0ac3cfaf0
Firmware Version: 04.04V01
User Capacity: 300,069,052,416 bytes [300 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Apr 19 16:03:33 2012 CST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 4800) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 59) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x303f) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 195 195 051 Pre-fail Always - 49036
3 Spin_Up_Time 0x0003 199 196 021 Pre-fail Always - 3008
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 425
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x000e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 086 086 000 Old_age Always - 10292
10 Spin_Retry_Count 0x0012 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 404
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 268
193 Load_Cycle_Count 0x0032 200 200 000 Old_age Always - 426
194 Temperature_Celsius 0x0022 117 100 000 Old_age Always - 30
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0010 200 200 000 Old_age Offline - 4
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 1
SMART Error Log Version: 1
ATA Error Count: 749 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 749 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 40 10 a6 4e 58 01 08 00:16:23.812 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:17.646 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:17.645 READ FPDMA QUEUED
ef 02 00 00 00 00 00 08 00:16:17.645 SET FEATURES [Enable write cache]
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
Error 748 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
60 08 10 9e 32 5b 00 08 00:16:11.412 READ FPDMA QUEUED
ef 02 00 00 00 00 00 08 00:16:11.412 SET FEATURES [Enable write cache]
60 00 30 1e cb 53 06 08 00:16:05.199 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.180 READ FPDMA QUEUED
Error 747 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:16:05.199 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.180 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:16:05.178 READ FPDMA QUEUED
Error 746 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.945 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:58.944 READ FPDMA QUEUED
Error 745 occurred at disk power-on lifetime: 6972 hours (290 days + 12 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 00 44 cb 53 40 Error: UNC at LBA = 0x0053cb44 = 5491524
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.727 READ FPDMA QUEUED
60 00 30 1e cb 53 06 08 00:15:52.726 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
